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A moving coil galvanometer consists of a coil in a uniform magnetic field Bo, suspended fro a fibre of torque constant C, current I produces a deflection O=nABoi/c where n is the number of turns and A is the area of the coil. The period of oscillation T=2?(I/C)1/2 where I is the moment of inertia. The resistance of the coil and the circuit in which it is placed is adjusted to give a critical dumping Rc=n2 A2Bo2/2(ic)1/2 . if the minimum detectable current produces deflection equal to thermal -root mean square value O, show that minimum current is given by
imin =( ?KT/ TRc)1/2
For the amplifier circuit shown below estimate the mid band voltage gain if the EARLY voltage (V A ) of the current mirror transistors is 80 volts. Assume the d.c biasing is optim
Q. Implement the following Boolean functions by employing 8-to-1multiplexers. (a) F 1 (A,B,C) = Σ m i (0, 2, 4, 6) (b) F 2 (A,B,C) = Σ m i (1, 3, 7)
There are many advantages of PLC a.The PLC was specifically designed for harsh conditions with electrical noise magnetic fields vibration extreme temperatures or humidit
Give some applications of nichrome. Nichrome is an alloy of iron, chromium, nickel and manganese. This is used for electric iron, for making heating elements and another hea
Bureau of Energy Efficiency Setting up of the Bureau of Energy Efficiency The Bureau of Energy Efficiency has been established with effect from 1st March, 2002 under the
Q. The unit impulse response h(t) of a linear system is h(t) = 5e -t cos(2t - 30°). Determine H(s).
Q. In order to minimize output voltage offsets in practical op-amp circuits, one provides a dc path from each input terminal to ground, makes each input terminal see the same exter
Q. Explain Current-to-Current Amplifier ? The circuit given in Figure is to amplify a current fed to the input of the op amp. Applying KCL at Y, i 1 + i S = i o S
Temperature Triggering At high temperature the leakage current of junction J 2 increases. This leakage current is collector current of tr 1 and Tr 2 . So rise in temperat
Negative test cases for testing mobile phones are: 1.taking out the SIM card and made a call 2. by invalid phone number 3. Made a call at which there is no tower signa
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