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Phantom or Fictitious Loading Method
While the capacity of meters under test is extremely high, testing with actual load method would includes a considerable loss of power and would not be economical too. Thus, to prevent wastage of power during testing, phantom load method is adopted. In these techniques, pressure circuit is supplied from a circuit of normal voltage source and the current circuit from a separate low voltage source. Therefore, total power consumed during testing becomes extremely small because of small pressure coil current at general voltage plus full load current at extremely less voltage for current circuit meter. Therefore, the meter under test in this condition simulates the full load condition through such phantom load kit.
Semiconductor Equations The semiconductor equations that are relating these variables are shown below: Carrier density: n = n i exp (E FN - E i / KT) (1)
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