Cmp compare instruction , Electrical Engineering

Assignment Help:

CMP Compare Instruction

This instruction is used to compare the contents  of register  or memory  with accumulator the contents of the operand remain  unaffected. There are two  formats.

 


Related Discussions:- Cmp compare instruction

State about the embedded web technology, State about the Embedded Web Techn...

State about the Embedded Web Technology Embedded Web Technology (EWT) This is a new technology which uses the Internet in real time to interact/control with a device which

Life interactive ups systems , Normal 0 false false false ...

Normal 0 false false false EN-IN X-NONE X-NONE Life   Interactive UPS Systems

Define resistance strain gauge, Q. Define Resistance Strain Gauge? Mech...

Q. Define Resistance Strain Gauge? Mechanical and civil engineers routinely employ the dependence of resistance on the physical dimensions of a conductor to measure strain. A s

EMI, Ask question (c) Reduce each of the given signal transmission situatio...

Ask question (c) Reduce each of the given signal transmission situations to a source, coupling path(s), and receptor: (i) AM radio transmission to the human ear. (ii) TV transmis

Resistance, if the sheet resistance of a tin oxide is 100 ohms, what is the...

if the sheet resistance of a tin oxide is 100 ohms, what is the thickness of the oxide layer?

Find the thevenin equivalent of the circuit, (a) Find the Thevenin equivale...

(a) Find the Thevenin equivalent of the circuit shown in Figure (a) at the terminals A-B. (b) Determine the impedance that must be connected to the terminals A-B so that it is m

Number of holes in valence band, Number of holes in valence band: Der...

Number of holes in valence band: Derive the expression for number of holes in valence band and Fermi level in an intrinsic semiconductor. (b) By that percentage does the

Interpoles, These are small poles fixed to the yoke and spaced in b/w the m...

These are small poles fixed to the yoke and spaced in b/w the main poles. They are wound with comparatively few heavy gauge Cu wire turns and are connected in series with the armat

TTL input logic circuit, I am building a testing device for the purpose of ...

I am building a testing device for the purpose of screening a 5801 BiMOS 8 BIT Parallel-input Latched Driver, I need help with input circuit to drive all 8 outputs one at a time. M

Write Your Message!

Captcha
Free Assignment Quote

Assured A++ Grade

Get guaranteed satisfaction & time on delivery in every assignment order you paid with us! We ensure premium quality solution document along with free turntin report!

All rights reserved! Copyrights ©2019-2020 ExpertsMind IT Educational Pvt Ltd