Measured d-spacings of si using traces

Reference no: EM133144411

Experimental

In all experiments powder samples were used. Here are the experimental details: pure Si powder, Al powder and TiC powder with two different sizes.

Instrument: GBC MMA XRD diffractometer with a Cu-Kα (λ = 1.5406 Å) radiation source.

Measured d-spacings of Si using Traces

Measured d-spacings using software Traces 6

Attachment:- Experimental results.rar

Reference no: EM133144411

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