Explain how serial-scan testing is implemented

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Reference no: EM131276015

1. Explain the terms controllability, observability, and fault coverage.

2. Why is it important to have a high fault coverage for a set of test vectors?

3. Explain how serial-scan testing is implemented.

4. Explain the principles of Built-In Self-Test (BIST). What are the advantages and disadvantages of BIST?

Reference no: EM131276015

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