Determine thickness of aluminum thinfilm based on parameters

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Reference no: EM13262352

A quartz crystal microbalance (QCM) was employed in a vacuum deposition process, where a thin film of aluminum was grown over a p-Si wafer. The oscillator frequency at the start of the process was 10.0050 MHz. Upon completion of the process the frequency was known to be 10.0175 MHz. The crystal used in the QCM was a typical AT-cut device with a 0.500" diameter. Determine the thickness of the aluminum thinfilm based upon these parameters.

Reference no: EM13262352

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