Design an input test sequence

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Reference no: EM131393135

1. Assume that 4-bit serial-load shift register contains an input stuck-at-0 fault at its second and third bits owing to manufacturing imperfection. Design an input test sequence to demonstrate these failures at the outputs of this 4-bit serial-load shift register.

2. Consider a gate-level implementation of a full adder. Design an economical test plan to test this full adder circuits.

Reference no: EM131393135

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